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Proceedings Paper

Ultrafast internal thermalization of photoexcited carriers in polar semiconductors
Author(s): Lucio Rota; Paolo Lugli; Thomas Elsaesser; Jagdeep Shah
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Paper Abstract

We present a combined experimental and theoretical study of the ultrafast internal thermalization of high energy carriers created by laser excitation. Luminescence up-conversion is used to monitor the spectral and temporal evolution of the photoexcited carrier distributions with a time resolution of about 100 fs. A Monte Carlo simulation joined with a molecular dynamics approach is then used to interpret the experimental results. We show that the coulomb interaction among carriers is responsible for the initial ultrafast thermalization. The simulation allow us to distinguish between binary carrier-carrier collisions and plasmon losses and reconcile the results obtained with time resolved vs. c.w. hot (e, angstroms) luminescence.

Paper Details

Date Published: 21 October 1992
PDF: 11 pages
Proc. SPIE 1677, Ultrafast Lasers Probe Phenomena in Semiconductors and Superconductors, (21 October 1992); doi: 10.1117/12.137678
Show Author Affiliations
Lucio Rota, Univ. di Modena (Italy)
Paolo Lugli, II Univ. di Roma (Italy)
Thomas Elsaesser, Technical Univ. Muenchen (Germany)
Jagdeep Shah, AT&T Bell Labs. (United States)

Published in SPIE Proceedings Vol. 1677:
Ultrafast Lasers Probe Phenomena in Semiconductors and Superconductors

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