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Proceedings Paper

Instrumentation of the variable-angle magneto-optic ellipsometer and its application to m-o media and other nonmagnetic films
Author(s): Andy Feng Lei Zhou; James Kevin Erwin; Masud Mansuripur
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Paper Abstract

A new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto- optical properties. The optical properties of several non-magnetic films are also measured.

Paper Details

Date Published: 13 August 1992
PDF: 23 pages
Proc. SPIE 1663, Optical Data Storage, (13 August 1992); doi: 10.1117/12.137551
Show Author Affiliations
Andy Feng Lei Zhou, Optical Sciences Ctr./Univ. of Arizona (United States)
James Kevin Erwin, Optical Sciences Ctr./Univ. of Arizona (United States)
Masud Mansuripur, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 1663:
Optical Data Storage
Donald B. Carlin; David B. Kay; Alfred A. Franken, Editor(s)

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