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Proceedings Paper

Simplified analysis of the readout waveform for an elliptical mark
Author(s): Takaya Tanabe; Yasuaki Tanaka; Ryoichi Arai
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Paper Abstract

A new, simplified readout waveform equation for an elliptical mark is analytically derived and confirmed. This approach easily treats an elliptical mark by using an equivalent rectangular mark having (delta) function width and equivalent readout beam spot. The equation is verified by comparison with precise numerical calculations. Good agreement is obtained for practical dimensions of optical recording. The equation gives the characteristics of the readout waveform directly from the elliptical mark.

Paper Details

Date Published: 13 August 1992
PDF: 8 pages
Proc. SPIE 1663, Optical Data Storage, (13 August 1992); doi: 10.1117/12.137542
Show Author Affiliations
Takaya Tanabe, NTT Interdisciplinary Labs. (Japan)
Yasuaki Tanaka, NTT Interdisciplinary Labs. (Japan)
Ryoichi Arai, NTT Interdisciplinary Labs. (Japan)

Published in SPIE Proceedings Vol. 1663:
Optical Data Storage
Donald B. Carlin; David B. Kay; Alfred A. Franken, Editor(s)

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