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Proceedings Paper

MTF measurements of a frame transfer CCD operating in TDI mode
Author(s): Peter Verhoeff; Philippe Alain Gondoin
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Paper Details

Date Published: 12 August 1992
PDF: 13 pages
Proc. SPIE 1656, High-Resolution Sensors and Hybrid Systems, (12 August 1992); doi: 10.1117/12.135924
Show Author Affiliations
Peter Verhoeff, TNO Institute of Applied Physics (Netherlands)
Philippe Alain Gondoin, European Space Agency/ESTEC (Netherlands)


Published in SPIE Proceedings Vol. 1656:
High-Resolution Sensors and Hybrid Systems
Morley M. Blouke; Winchyi Chang; Laurence J. Thorpe; Rajinder P. Khosla, Editor(s)

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