Share Email Print
cover

Proceedings Paper

Fabrication, performance, and reliability of strained InGaAs QW lasers
Author(s): Naresh Chand; Niloy K. Dutta; Sung-Nee G. Chu; William S. Hobson; John Lopata; R. Wetzel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Very low threshold current density (<50A cm-2, close to the theoretical limit), high quantum efficiency, high power output, low temperature sensitivity, and higher pumping efficiency of 0.98 µm wavelength InGaAs strained quantum well lasers, and very low amplifier noise close to the 3 dB quantum limit have made the 0.98 µm wavelength as the best choice for pumping Er3+-doped fiber amplifiers. Like any other semiconductor laser, these lasers also degrade, but no failure mode specific to these lasers has been observed despite a compressive strain of 1-3 x 10+10 dynes/cm2 in the active QW region. On the contrary, these lasers have immunity to sudden failure and for reasons discussed in the text they show signs of longer lifetimes than their AlGaAs/GaAs counterparts. We expect the 0.98 µm laser reliability to improve in the near future to a level comparable to any other types of semiconductor laser. Narrow far field, high power output in the fundamental transverse mode centered at 0.98 ± 0.005 µm, planarity of the structure for ease of mounting and better heat sinking, and long lifetimes are the major laser structure design considerations.

Paper Details

Date Published: 1 February 1992
PDF: 12 pages
Proc. SPIE 1580, Fiber Optic Components and Reliability, (1 February 1992); doi: 10.1117/12.135364
Show Author Affiliations
Naresh Chand, AT&T Bell Labs. (United States)
Niloy K. Dutta, AT&T Bell Labs. (United States)
Sung-Nee G. Chu, AT&T Bell Labs. (United States)
William S. Hobson, AT&T Bell Labs. (United States)
John Lopata, AT&T Bell Labs. (United States)
R. Wetzel, AT&T Bell Labs. (United States)


Published in SPIE Proceedings Vol. 1580:
Fiber Optic Components and Reliability
Paul M. Kopera; Dilip K. Paul, Editor(s)

© SPIE. Terms of Use
Back to Top