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Proceedings Paper

Defect detection on composite materials by phase-step interferometry
Author(s): Xia Zhao; Yueguang Lu; Gen-shan Jinag
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Paper Abstract

Phase-step interferometry is a novel method in modern optical technology. In this paper, the basic principles of the technique are briefly described. A holographic phase-step system for the detection on composite materials was presented. The automatic recognition method of the defect by computer was also discussed.

Paper Details

Date Published: 1 January 1992
PDF: 4 pages
Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135348
Show Author Affiliations
Xia Zhao, China Univ. of Mining (China)
Yueguang Lu, The 3rd Research Lab. (China)
Gen-shan Jinag, Northern China Electrical Institute (China)

Published in SPIE Proceedings Vol. 1553:
Laser Interferometry IV: Computer-Aided Interferometry
Ryszard J. Pryputniewicz, Editor(s)

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