Share Email Print
cover

Proceedings Paper

Relationship between Fourier fringe analysis and the FFT
Author(s): Andrew A. Malcolm; David R. Burton
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The use of Fourier fringe analysis as a tool for surface characterization has been well documented. However, there remain several grey areas in the implementation of this technique as a practical tool. Principal among these is the catalog of errors associated with the backbone of the technique--the Fast Fourier Transform. These errors are well known, but their nature and form in this context are not fully understood. This paper gives a detailed review of these problems together with their impact on quantitative measurements and presents possible routes to their elimination and solution.

Paper Details

Date Published: 1 January 1992
PDF: 12 pages
Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135314
Show Author Affiliations
Andrew A. Malcolm, Liverpool Polytechnic (United Kingdom)
David R. Burton, Liverpool Polytechnic (United Kingdom)


Published in SPIE Proceedings Vol. 1553:
Laser Interferometry IV: Computer-Aided Interferometry
Ryszard J. Pryputniewicz, Editor(s)

© SPIE. Terms of Use
Back to Top