Share Email Print

Proceedings Paper

Relationship between Fourier fringe analysis and the FFT
Author(s): Andrew A. Malcolm; David R. Burton
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of Fourier fringe analysis as a tool for surface characterization has been well documented. However, there remain several grey areas in the implementation of this technique as a practical tool. Principal among these is the catalog of errors associated with the backbone of the technique--the Fast Fourier Transform. These errors are well known, but their nature and form in this context are not fully understood. This paper gives a detailed review of these problems together with their impact on quantitative measurements and presents possible routes to their elimination and solution.

Paper Details

Date Published: 1 January 1992
PDF: 12 pages
Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135314
Show Author Affiliations
Andrew A. Malcolm, Liverpool Polytechnic (United Kingdom)
David R. Burton, Liverpool Polytechnic (United Kingdom)

Published in SPIE Proceedings Vol. 1553:
Laser Interferometry IV: Computer-Aided Interferometry
Ryszard J. Pryputniewicz, Editor(s)

© SPIE. Terms of Use
Back to Top