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Proceedings Paper

Optimization of the ESPI technique for extended practically oriented deformation measurements
Author(s): Gerd Guelker; Olaf Haack; Klaus D. Hinsch; Claudia Hoelscher; Juergen Kuls
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Paper Abstract

Substitution of common lasers by small laser diodes gains increasing popularity since it serves for compactness of measurement systems. The possibility of tuning the emitted wavelength simply by changing the injection current is very attractive for systems applying phase shift methods. Usage of optomechanical elements to produce the required phase shifts is superseded. Phase shifting by laser diode tuning was implemented into the presented electronic speckle pattern interferometry (ESPI) setup. Automatic evaluation of fringe systems is done using the Carre phase shift method. Influences of variations of laser power due to changed injection current and decorrelation of speckle patterns due to the altered wavelength are found to be neglectable.

Paper Details

Date Published: 1 January 1992
PDF: 8 pages
Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135301
Show Author Affiliations
Gerd Guelker, Carl-von-Ossietzky Univ. Oldenburg (Germany)
Olaf Haack, Carl-von-Ossietzky Univ. Oldenburg (Germany)
Klaus D. Hinsch, Carl-von-Ossietzky Univ. Oldenburg (Germany)
Claudia Hoelscher, Carl-von-Ossietzky Univ. Oldenburg (Germany)
Juergen Kuls, Carl-von-Ossietzky Univ. Oldenburg (Germany)


Published in SPIE Proceedings Vol. 1553:
Laser Interferometry IV: Computer-Aided Interferometry
Ryszard J. Pryputniewicz, Editor(s)

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