Share Email Print
cover

Proceedings Paper

High-speed diagnostic interferometer
Author(s): Jacobus M. Oschmann; James Kiraly
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An Integrated Beam Control Demonstration (IBCD) is being fabricated by Hughes Danbury Optical Systems (HDOS) for the Strategic Defense Initiative Organization under the direction of the Naval Surface Warfare Center. The IBCD will validate critical technologies for the space based laser Advance Beam Control System (ABCS) Program. One of the system requirements is to provide a means of independently sense and record the wavefront of the main infrared test beam during highly dynamic beam control demonstrations. HDOS developed a design concept and specification for a High Speed Diagnostic Interferometer (HSDI) to meet this requirement. Phase Shift Technology finalized the design and produced the instrument described in this paper under a subcontract from HDOS. The HSDI is an IR phase measuring interferometer operating at 1.321 microns using a PtSi array at 950 frames per second. The system collects up to 256 frames over a 64 X 64 array. A long travel (40 micron) phase shifting device moves the reference mirror to cause a 90 degree phase shift per frame. The data collected is digitized in real time and may be played back, stored to disk or analyzed immediately. Details of the optical system, high speed PtSi camera, long travel phase shifting device, electronics and software are given. Data collection, PZT calibration, and analysis techniques are discussed and results are presented. Examples of this system using menu driven PC based software are presented.

Paper Details

Date Published: 1 January 1992
PDF: 11 pages
Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135289
Show Author Affiliations
Jacobus M. Oschmann, Phase Shift Technology (United States)
James Kiraly, Hughes Danbury Optical Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 1553:
Laser Interferometry IV: Computer-Aided Interferometry
Ryszard J. Pryputniewicz, Editor(s)

© SPIE. Terms of Use
Back to Top