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Proceedings Paper

White light interferometer for measuring polarization extinction ratio
Author(s): James P. Waters; Daniel J. Fritz
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Paper Abstract

A white light interferometer was developed for measuring polarization extinction ratios in proton-exchanged, integrated-optic (IO) chips. Usually, such measurements require expensive strain-free polarization components. The instrument which was developed at United Technologies Research Center measured extinction ratios in excess of 95 dB using only interferometric quality optics. The system used a superluminescent diode operating at 825 nanometers as the illumination source and two interferometers combined in series, a measurement interferometer and an analyzing interferometer. The measurement interferometer relied upon the two axes of polarization in the IO chip having different optical pathlengths and the analyzing interferometer was a modified Mach-Zehnder. Results using this system on the IO chips showed that the extinction ratio was 58 dB.

Paper Details

Date Published: 1 January 1992
PDF: 9 pages
Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135287
Show Author Affiliations
James P. Waters, United Technologies Research Ctr. (United States)
Daniel J. Fritz, United Technologies Research Ctr. (United States)

Published in SPIE Proceedings Vol. 1553:
Laser Interferometry IV: Computer-Aided Interferometry
Ryszard J. Pryputniewicz, Editor(s)

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