Share Email Print
cover

Proceedings Paper

Scanning cone-beam reconstruction algorithms for x-ray microtomography
Author(s): Ge Wang; T. H. Lin; Ping Chin Cheng; D. M. Shinozaki; Hyo-Gun Kim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An x-ray shadow projection microscope using a scannable point source of x-rays is under development at SUNY. The point source is generated by a focused electron beam that can be steered electromagnetically in a plane perpendicular to the optical axis of the microscope. The specimen is mounted on a rotatable mechanical stage for microtomography. An elaborate feedback system is being implemented to measure and correct the motion error of the mechanical stage. The conventional cone-beam image reconstruction algorithm suffers from two constraints. Firstly, the specimen must be contained in a sphere-like reconstruction region. Secondly, the x-ray source must be moved along a circle in the specimen coordinate system. Considering the characteristics of the x-ray microscope system of ARTS-AMIL and the limitations of the conventional cone-beam reconstruction algorithm, a general cone-beam image reconstruction algorithm is presented. The general algorithm can be applied to various scanning geometries, such as polygonal, helical, or random scanning patterns, for different reasons. In order to study the general cone-beam reconstruction algorithm, a computer simulation has been performed. With various scanning parameters, projection data were generated mathematically and then the general cone-beam reconstruction algorithm tested with the simulated data. The experimental results shows that the different kinds of scanning loci of the x-ray source consistently resulted in satisfactory 3-D reconstructed images.

Paper Details

Date Published: 1 February 1992
PDF: 14 pages
Proc. SPIE 1556, Scanning Microscopy Instrumentation, (1 February 1992); doi: 10.1117/12.134891
Show Author Affiliations
Ge Wang, SUNY/Buffalo (United States)
T. H. Lin, SUNY/Buffalo (United States)
Ping Chin Cheng, SUNY/Buffalo (United States)
D. M. Shinozaki, Univ. of Western Ontario (Canada)
Hyo-Gun Kim, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 1556:
Scanning Microscopy Instrumentation
Gordon S. Kino, Editor(s)

© SPIE. Terms of Use
Back to Top