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Proceedings Paper

Nanoscale semiconductor impurity characterization by scanned probe microscopy (Invited Paper)
Author(s): K. S. Mak; Clayton C. Williams
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Paper Abstract

Measurement of impurity dopant density in silicon with lateral resolution on the 100 nm scale has been demonstrated with the scanning capacitance microscope (SCM). This approach is based on the measurement of local capacitance changes between a 50 nm tip and semiconductor surface as the voltage bias is changed and/or the tip is scanned laterally across the surface. Capacitance versus voltage measurements provide a means to quantitatively determine local dopant density. We describe the scanning capacitance microscope and its application to dopant density measurements in semiconductors. We review the application of SCM to the measurement of dopant density on the nanometer scale.

Paper Details

Date Published: 1 February 1992
PDF: 9 pages
Proc. SPIE 1556, Scanning Microscopy Instrumentation, (1 February 1992); doi: 10.1117/12.134890
Show Author Affiliations
K. S. Mak, Univ. of Utah (United States)
Clayton C. Williams, Univ. of Utah (United States)


Published in SPIE Proceedings Vol. 1556:
Scanning Microscopy Instrumentation
Gordon S. Kino, Editor(s)

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