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Proceedings Paper

Metrics for metrology on an atomic scale (Abstract Only)
Author(s): E. Clayton Teague
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Paper Abstract

The focus of this paper is on the principal means of realizing a metric appropriate for atomic scale metrology. These are evaluated to determine the systematic uncertainties involved in relating sensed displacements to the international standard of length.

Paper Details

Date Published: 1 February 1992
PDF: 2 pages
Proc. SPIE 1556, Scanning Microscopy Instrumentation, (1 February 1992); doi: 10.1117/12.134887
Show Author Affiliations
E. Clayton Teague, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 1556:
Scanning Microscopy Instrumentation
Gordon S. Kino, Editor(s)

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