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Proceedings Paper

Imaging of near-field diffraction patterns with subwavelength resolution in the optical region
Author(s): Duncan J. Butler; Keith A. Nugent; Ann Roberts; Patrick D. Kearney
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Paper Abstract

Near-field microscopy techniques are ideally suited for the determination of optical electromagnetic field structures with high spatial resolution. In this paper we report some preliminary results of our experiments on the near-field diffraction by a straight-edge and on the fields emanating from a single mode optical fiber. It is suggested that near-field techniques might provide an excellent approach to characterizing the properties of optical fibers.

Paper Details

Date Published: 1 February 1992
PDF: 9 pages
Proc. SPIE 1556, Scanning Microscopy Instrumentation, (1 February 1992); doi: 10.1117/12.134884
Show Author Affiliations
Duncan J. Butler, Univ. of Melbourne (Australia)
Keith A. Nugent, Univ. of Melbourne (Australia)
Ann Roberts, Univ. of Melbourne (Australia)
Patrick D. Kearney, Univ. of Melbourne (Australia)


Published in SPIE Proceedings Vol. 1556:
Scanning Microscopy Instrumentation
Gordon S. Kino, Editor(s)

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