Share Email Print
cover

Proceedings Paper

Precision evaluation of lens systems using a nodal slide/MTF optical bench
Author(s): Victor J. Doherty; Philip D. Chapnik
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A compact, self-contained production instrument designed to permit the rapid and precise performance characterization of a wide variety of lenses and optical systems has been developed by Eidolon Corporation. The Eidolon Production Nodal Slide/MTF Measurement System can be used to measure effective focal length (EFL), distortion, field curvature, chromatic aberration, spot size, and modulation transfer function (MTF).

Paper Details

Date Published: 1 January 1992
PDF: 6 pages
Proc. SPIE 1531, Advanced Optical Manufacturing and Testing II, (1 January 1992); doi: 10.1117/12.134851
Show Author Affiliations
Victor J. Doherty, Eidolon Corp. (United States)
Philip D. Chapnik, Eidolon Corp. (United States)


Published in SPIE Proceedings Vol. 1531:
Advanced Optical Manufacturing and Testing II
Victor J. Doherty, Editor(s)

© SPIE. Terms of Use
Back to Top