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Proceedings Paper

Two holographic methods for flatness testing with subwavelength or multiple-wavelength sensitivity
Author(s): Pierre Michel Boone; Pierre M. Jacquot
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Paper Abstract

Two holographic methods suited for the measurement of flatness deviation are presented. The first one takes advantage of the basic holographic interferometry arrangement usually meant for deformation analysis of rough bodies. Simple modifications allow flatness measurement of polished surfaces with sub-wavelength sensitivity. Secondly, a new desensitized interferometer is described allowing the measurement of rougher objects, more frequently encountered in engineering practice. The key component of this interferometer is a diffractive optical element produced by recording two wave interference patterns. Desensitization factors ranging from 1 to 100 with respect to a Fizeau interferometer can be achieved. Flatness checks of computer disks demonstrate the possibilities of both interferometers. Deformation measurements performed with the desensitized interferometer are presented.

Paper Details

Date Published: 20 October 1992
PDF: 9 pages
Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132159
Show Author Affiliations
Pierre Michel Boone, Univ. of Gent (Belgium)
Pierre M. Jacquot, Swiss Federal Institute of Technology (Switzerland)

Published in SPIE Proceedings Vol. 1720:
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
Jumpei Tsujiuchi, Editor(s)

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