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Proceedings Paper

Two-wavelength laser-diode interferometry with electronic calibration techniques
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Paper Abstract

A two-wavelength laser-diode (LD) interferometer has been constructed that is based on a phase-shifting technique with an electronic calibration. The phases are equally shifted in opposite directions to each other on an unbalanced interferometer using two wavelengths changed stepwise by separately varying the currents in dual LDs. A feedback interferometer is described with electronics to calibrate the phase shifts and to lock the interferometer on a phase-shift condition by controlling the bias and modulation currents of both LDs. The experimental result is shown to measure a diffraction grating with a 4.6 micrometers synthetic wavelength.

Paper Details

Date Published: 20 October 1992
PDF: 6 pages
Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132155
Show Author Affiliations
Ribun Onodera, Univ. of Industrial Technology (Japan)
Yukihiro Ishii, Univ. of Industrial Technology (Japan)


Published in SPIE Proceedings Vol. 1720:
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

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