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Proceedings Paper

Surface roughness and waviness measurements for optical parts (Invited Paper)
Author(s): Thomas C. Bristow
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Paper Abstract

This article describes surface roughness and waviness measurements for optical parts. The basic description of roughness is reviewed for a digital surface profiler and comparisons made for the lower spectrum description of surface topography. The power spectrum analysis is also reviewed with a special emphasis on a low variance algorithm. Applications for the optics industry for both flat and curved parts are presented.

Paper Details

Date Published: 20 October 1992
PDF: 4 pages
Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132118
Show Author Affiliations
Thomas C. Bristow, Chapman Instruments (United States)


Published in SPIE Proceedings Vol. 1720:
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

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