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Proceedings Paper

Present and future standard specimens for surface-finish metrology (Summary Only)
Author(s): Theodore V. Vorburger; Jun-Feng Song; Egon Marx; Robert I. Scace; Thomas Robert Lettieri
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Paper Abstract

The accurate measurement of surface finish requires standard specimens to calibrate and check the operation of the measuring instruments. This is true both for profiling techniques such as the stylus and area averaging techniques such as light scattering. For profiling stylus instruments, the international standard ISO 5436 has enumerated four types of standard specimens which may be classified as step height specimens, periodic roughness specimens, random roughness specimens, and specimens for checking probe tip resolution. A draft of a related U.S. standard uses the same taxonomy. For light scattering instruments, the use of standard specimens are discussed in the ASTM standard for total integrated scatter. In addition, several ad hoc standard specimens have been used in an interlaboratory comparison of instruments that measure the bidirectional reflectance distribution function (BRDF). Our group has developed a series of specimens, known as standard reference materials (SRMs), for calibrating stylus profiling instruments. We are also in the process of developing a series of profile specimens for calibrating the linearity of BRDF instruments. Both types of specimens have sinusoidal profiles and are discussed in turn.

Paper Details

Date Published: 20 October 1992
PDF: 4 pages
Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132112
Show Author Affiliations
Theodore V. Vorburger, National Institute of Standards and Technology (United States)
Jun-Feng Song, National Institute of Standards and Technology (United States)
Egon Marx, National Institute of Standards and Technology (United States)
Robert I. Scace, National Institute of Standards and Technology (United States)
Thomas Robert Lettieri, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1720:
Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

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