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Proceedings Paper

High-resolution pin scanning microscopy
Author(s): Jerzy Zieniuk
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Paper Abstract

The idea of high resolution pin scanning microscopy is presented. A comparison between a scanning head of classical acoustical microscopy and the pin one are described. Construction details of the pin scanning system and some results obtained are shown and discussed.

Paper Details

Date Published: 25 November 1992
PDF: 10 pages
Proc. SPIE 1844, Acousto-Optics and Applications, (25 November 1992); doi: 10.1117/12.131933
Show Author Affiliations
Jerzy Zieniuk, Institute of Fundamental Technological Research (Poland)

Published in SPIE Proceedings Vol. 1844:
Acousto-Optics and Applications
Antoni Sliwinski; Piotr Kwiek; B. Linde; A. Markiewicz, Editor(s)

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