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Proceedings Paper

Surface roughness investigations of thin film disks used in magnetic recording technology
Author(s): Min Yang; Frank E. Talke
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Paper Abstract

Scanning tunneling microscopy (STM) is used to study the surface roughness of thin film magnetic recording disks obtained from various vendors. The height distributions of the disk surfaces are obtained and the bearing area curves are examined using `probability scaling.'' Skewness and kurtosis of the individual disk surfaces are calculated and deviation of the height distributions and bearing area curves from Gaussian behavior is determined. Surface roughness data from scanning tunneling microscopy measurements are compared qualitatively with those obtained from optical noncontact profilometry.

Paper Details

Date Published: 28 October 1992
PDF: 9 pages
Proc. SPIE 1816, Electro-Optic Computer Peripherals Technology, (28 October 1992); doi: 10.1117/12.131330
Show Author Affiliations
Min Yang, Univ. of California/San Diego (United States)
Frank E. Talke, Univ. of California/San Diego (United States)


Published in SPIE Proceedings Vol. 1816:
Electro-Optic Computer Peripherals Technology
Eric G. Lean; Min-Shyong Lin, Editor(s)

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