Share Email Print

Proceedings Paper

Fiber optic electronic speckle pattern interferometry and its application to sensors
Author(s): Wei Liu; Yushan Tan; Xianglin Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This study concentrates on using multimode and singlemode fiber in electronic speckle pattern interferometry (ESPI) to measure deformation and nondestructive testing. The advantages and disadvantages of singlemode versus multimode fiber optic components are discussed. Several experiments which research the problems of applying fiber optics to ESPI for measuring displacement, unbonded faults in the carbon/epoxy honeycomb components are introduced. A series of methods were used to achieve good contrast interference fringes. All the experimental results agree well with the theory.

Paper Details

Date Published: 26 October 1992
PDF: 8 pages
Proc. SPIE 1814, Optical Sensors, (26 October 1992); doi: 10.1117/12.131285
Show Author Affiliations
Wei Liu, Xi'an Jiaotong Univ. (China)
Yushan Tan, Xi'an Jiaotong Univ. (China)
Xianglin Wang, Xi'an Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 1814:
Optical Sensors
Chih-Hong Chen; Tieh-Chu Wang, Editor(s)

© SPIE. Terms of Use
Back to Top