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Proceedings Paper

Reliability of high-power semiconductor laser arrays
Author(s): Hsing H. Kung; Richard R. Craig; Erik P. Zucker; Benjamin Li; Donald R. Scifres
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Paper Abstract

The reliability of continuously operating (cw) high power laser arrays is a critical factor for the acceptance of these devices in a wide range of applications. Extensive investigation into the reliability of semiconductor lasers has led to an improved understanding of failure mechanisms such as material defects, mirror damage and solder related failures as well as to methods which significantly suppress the occurrence of catastrophic failure. Furthermore, as a result of material quality improvements, laser arrays exhibit very low gradual degradation for high power operation up to 2 Watts cw. Long term lifetest data shows that the projected medium life at room temperature of such devices exceed 100,000 hours at 2 W cw.

Paper Details

Date Published: 23 October 1992
PDF: 5 pages
Proc. SPIE 1813, Optoelectronic Component Technologies, (23 October 1992); doi: 10.1117/12.131263
Show Author Affiliations
Hsing H. Kung, Spectra Diode Labs., Inc. (United States)
Richard R. Craig, Spectra Diode Labs., Inc. (United States)
Erik P. Zucker, Spectra Diode Labs., Inc. (United States)
Benjamin Li, Spectra Diode Labs., Inc. (United States)
Donald R. Scifres, Spectra Diode Labs., Inc. (United States)

Published in SPIE Proceedings Vol. 1813:
Optoelectronic Component Technologies
GouChung Chi; Chi-Shain Hong, Editor(s)

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