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Proceedings Paper

Analysis of STEM images on a RISC workstation with an APL interface
Author(s): Oscar H. Kapp; Shengyang Ruan
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Paper Abstract

We have developed a stand-alone image processing system with an interface to an APL interpreter on a second generation RISC workstation to analyze digital images from our scanning transmission electron microscopes (STEM). The system is UNIX based and utilizes the X-Windows system to display images and to toggle between different environments.

Paper Details

Date Published: 1 August 1992
PDF: 3 pages
Proc. SPIE 1778, Imaging Technologies and Applications, (1 August 1992); doi: 10.1117/12.130967
Show Author Affiliations
Oscar H. Kapp, Univ. of Chicago (United States)
Shengyang Ruan, Univ. of Chicago (United States)

Published in SPIE Proceedings Vol. 1778:
Imaging Technologies and Applications
Robert J. Heaston, Editor(s)

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