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Proceedings Paper

Apparatus for measuring 3.39-μm laser beam divergence
Author(s): Fuyun Xu
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Paper Abstract

Apparatus for accuracy measuring 3.39 micrometers laser beam divergence is introduced in this article, which principle is based on the interference phenomena of polarized beams in crystal.

Paper Details

Date Published: 10 December 1992
PDF: 2 pages
Proc. SPIE 1752, Current Developments in Optical Design and Optical Engineering II, (10 December 1992); doi: 10.1117/12.130725
Show Author Affiliations
Fuyun Xu, Shandong Architectural Engineering Institute (China)


Published in SPIE Proceedings Vol. 1752:
Current Developments in Optical Design and Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

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