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Proceedings Paper

Using moire method of measuring optical disks
Author(s): Ter-Chin Cheng; Sheng-Nan Jiang; Rang-Seng Chang
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Paper Abstract

A primary function of compact disk measuring systems is the measurement of various types of defects which represent either functional or cosmetic flaws and the measurement of the profile of the compact disk. Functional flaws can make a very bad interference with the reproduction of the recorded music. Cosmetic flaws are visual imperfections whose presence can cause the rejecting of the disc by the production line. A projection moire method is invented in which a light beam passes through a grating, and is projected onto the object by overlapping with the virtual grating in the computer software. The object's 3-dimensional profile will be reconstructed and the object's profile quality can be improved by our new method for moire image processing.

Paper Details

Date Published: 10 December 1992
PDF: 7 pages
Proc. SPIE 1752, Current Developments in Optical Design and Optical Engineering II, (10 December 1992); doi: 10.1117/12.130724
Show Author Affiliations
Ter-Chin Cheng, National Central Univ. (Taiwan)
Sheng-Nan Jiang, National Central Univ. (Taiwan)
Rang-Seng Chang, National Central Univ. (Taiwan)


Published in SPIE Proceedings Vol. 1752:
Current Developments in Optical Design and Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

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