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Proceedings Paper

Calibration of an EUV spectrometer using synchrotron radiation to distinguish overlapping orders
Author(s): Steven N. Osterman; Gary J. Rottman
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Paper Abstract

We have calibrated a high resolution EUV spectrometer in three spectroscopic orders using the National Institute for Science and Technology's Synchrotron Ultraviolet Radiation Facility (SURF-II) at Gaithersburg, MD. The spectrometer was the principal instrument on a University of Colorado sounding rocket experiment, with a first order bandpass of roughly 5.8 nm centered at 155.5 nm, and resolving power of 4 X 104. Synchrotron radiation provides a well calibrated, columnated and polarized light source well suited to photometric calibration. The spectral distribution of synchrotron radiation is extremely well known from the theory of synchrotron radiation, and the spectral shape and intensity are directly related to the electron beam energy and current. If the instrument is calibrated at as many different beam energies as there are spectroscopic orders, then the spectrometer efficiency in each order can be determined from a single set of simultaneous equations. A difficulty arises in that the system of equations can be sensitive to perturbations of the level of experimental uncertainty. We have been able to reduce the number of unknowns by independently determining the first order efficiency and thus overdetermine the set of equations. The resulting efficiency measurements are accurate and reliable.

Paper Details

Date Published: 8 October 1992
PDF: 12 pages
Proc. SPIE 1743, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III, (8 October 1992); doi: 10.1117/12.130707
Show Author Affiliations
Steven N. Osterman, Univ. of Colorado/Boulder (United States)
Gary J. Rottman, Univ. of Colorado/Boulder (United States)


Published in SPIE Proceedings Vol. 1743:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III
Oswald H. W. Siegmund, Editor(s)

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