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Proceedings Paper

Microstrip proportional-counter development at MSFC
Author(s): Melinda Ann Fulton; Jeffery J. Kolodziejczak; Brian D. Ramsey
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Paper Abstract

Microstrip detectors are an exciting new development in proportional counter design in which the planes of discrete anode and cathode wires are replaced by conducting strips on an insulating or partially insulating substrate. The microstrips are fabricated using integrated circuit-type photolithography techniques and therefore offer very high spatial accuracy and uniformity. A development program is underway at Marshall Space Flight Center (MSFC) to produce large-area microstrips for use in an x-ray detector balloon flight program and to investigate the general performance limits of these new devices. Microstrips tested so far have been fabricated both in-house using standard photolithographic techniques and by an outside contractor using electron beam technology. Various substrate materials have been tested along with different electrode configurations. The distributions of pickup on subdivided cathodes on both top and bottom surfaces of the microstrips are also being investigated for use as two- dimensional imaging detectors. Data from these tests in the development of a large-area device will be presented.

Paper Details

Date Published: 8 October 1992
PDF: 8 pages
Proc. SPIE 1743, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III, (8 October 1992); doi: 10.1117/12.130673
Show Author Affiliations
Melinda Ann Fulton, NASA Marshall Space Flight Ctr. (United States)
Jeffery J. Kolodziejczak, NASA Marshall Space Flight Ctr. (United States)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 1743:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III
Oswald H. W. Siegmund, Editor(s)

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