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Proceedings Paper

Instrumentation for strain measurements using cylindrically bent perfect crystals
Author(s): Petr Lukas; Miroslav Vrana; Pavel Mikula; Jiri Kulda
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Paper Abstract

Experimental tests of elastically bent Si crystals as monochromator and analyzer in a triple- axis setup for investigation of stress fields in polycrystalline materials are presented. It is also demonstrated that if certain focusing conditions for a bent monochromator are met the beam diffracted by a polycrystalline sample becomes quasi-parallel which enables high resolution measurements directly with a PSD without the use of a collimator or a crystal-analyzer. In the three axis setup maximum sensitivity in determination of (Delta) d/d <EQ 10-4 can be achieved permitting profile-broadening analysis for reasonable sample volumes and counting times.

Paper Details

Date Published: 23 November 1992
PDF: 9 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130654
Show Author Affiliations
Petr Lukas, Nuclear Physics Institute (Czech Republic)
Miroslav Vrana, Nuclear Physics Institute (Czech Republic)
Pavel Mikula, Nuclear Physics Institute (Czech Republic)
Jiri Kulda, Nuclear Physics Institute and Institut Laue-Langevin (France)

Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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