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Proceedings Paper

Use of focusing by bent perfect Si crystals for short-wavelength neutron monochromatization
Author(s): Volker Wagner; Pavel Mikula
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Paper Abstract

Reflectivity and resolution properties of cylindrically bent silicon crystals were investigated for their possible employment as short wavelength monochromators. We report flux density measurements of monochromatic neutrons at the sample position of a conventional diffractometer in the wavelength range from 0.05 nm to 0.09 nm for Si(311) and Si(422) reflections. From the obtained data, the optimum crystal thickness and bending radius for a chosen neutron wavelength and the gain in intensity in comparison with a flat mosaic monochromator can be estimated. Further, the use of momentum space focusing in diffraction experiments is discussed.

Paper Details

Date Published: 23 November 1992
PDF: 7 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130653
Show Author Affiliations
Volker Wagner, Physikalisch-Technische Bundenstalt Braunschweig and Nuclear Physi (Germany)
Pavel Mikula, Physikalisch-Technische Bundenstalt Braunschweig and Nuclear Physi (Czech Republic)

Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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