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Proceedings Paper

Promise of silicon wafer microguides for future neutron optical elements
Author(s): David F. R. Mildner; Huaiyu Heather Chen-Mayer; Andreas Magerl; U. Gruening
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Paper Abstract

The usually large cross section of the incident neutron beam is divided in the microguide into a large number of thin slices. This allows the neutron beam to be deviated by a large angle within a short distance and enables the design of an efficient neutron lens by giving the stack an appropriate shape. We present a novel approach for high quality microguides by using thin and thus flexible single crystal silicon wafers as the neutron transmitting medium, coated with optimized neutron reflecting thin-film materials. A crucial issue concerns the reflection coefficient R of the silicon thin-film interface. We have performed neutron transmission measurements through commercially available 200 micrometers thin wafers coated in both sides with nickel. Various rocking curves have been taken on assemblies of straight wafers with neutron pathways from 50 to 200 mm in silicon, and on curved wafers. A reflectivity value of 0.988 +/- 0.005 has been found for a neutron wavelength of 7 angstroms.

Paper Details

Date Published: 23 November 1992
PDF: 9 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130647
Show Author Affiliations
David F. R. Mildner, National Institute of Standards and Technology (United States)
Huaiyu Heather Chen-Mayer, National Institute of Standards and Technology (United States)
Andreas Magerl, Institut Laue-Langevin (Germany)
U. Gruening, Institut Laue-Langevin (France)


Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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