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Proceedings Paper

Subsurface profile refinement for neutron specular reflectivity (Invited Paper)
Author(s): John F. Ankner; Charles F. Majkrzak
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Paper Abstract

The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.

Paper Details

Date Published: 23 November 1992
PDF: 10 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130637
Show Author Affiliations
John F. Ankner, National Institute of Standards and Technology (United States)
Charles F. Majkrzak, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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