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Proceedings Paper

Determination of reflectivity curves of multilayer neutron monochromators
Author(s): Alexander Mihai Popovici; Brent J. Heuser; William B. Yelon; John E. Keem
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Paper Abstract

The technique of measuring neutron multilayer monochromator reflectivities by double diffraction rocking curves is discussed. Two problems encountered are deposition induced curvature of multilayer support and lateral variation of layer spacing. Transmitted rocking curves were measured with a narrow detector in an effort to understand these specific problems. General formulae for interpretation of such rocking curves are derived and the methodology for determining relevant parameters is discussed. Measured reflectivities of 10 nm spacing Ni-Ti multilayer devices are presented. Consideration of support curvature and layer spacing variation is essential in understanding observed data.

Paper Details

Date Published: 23 November 1992
PDF: 11 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130631
Show Author Affiliations
Alexander Mihai Popovici, Univ. of Missouri (United States)
Brent J. Heuser, Univ. of Missouri/Columbia (United States)
William B. Yelon, Univ. of Missouri/Columbia (United States)
John E. Keem, Ovonic Synthetic Materials Co. (United States)

Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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