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Proceedings Paper

Thin films for neutron optics
Author(s): O. Elsenhans; Peter Boeni; H. P. Friedli; Hans Grimmer; Philippe A. Buffat; K. Leifer; Ian S. Anderson
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Paper Abstract

Thin film multilayers play a crucial role in the efficient transport of neutrons from the source to the experiments at the Swiss Neutron Spallation source SINQ. In order to develop and optimize the neutron optical components, a magnetron sputtering facility has been installed at PSI aimed at the deposition of thin films covering large substrate area. Initial uniformity tests are very encouraging showing thickness variation of only 1% for 5 nm layers over an area of 500 X 400 mm2. A detailed study of the structure and stability of Ni/Ti multilayers in relation to the deposition conditions is underway and results from analysis using TEM, neutron and x-ray diffraction and reflection are presented. The results point toward the use of alloyed materials and reactive sputtering to sharpen and stabilize the interface between Ni and Ti.

Paper Details

Date Published: 23 November 1992
PDF: 11 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130624
Show Author Affiliations
O. Elsenhans, Paul Scherrer Institute (Switzerland)
Peter Boeni, Paul Scherrer Institute (Germany)
H. P. Friedli, Paul Scherrer Institute (Switzerland)
Hans Grimmer, Paul Scherrer Institute (Switzerland)
Philippe A. Buffat, Ecole Polytechnique Federale (Switzerland)
K. Leifer, Ecole Polytechnique Federale (Switzerland)
Ian S. Anderson, Institut Laue-Langevin (United States)

Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

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