Share Email Print
cover

Proceedings Paper

Thermal stability of [Ni-Ti] multilayers
Author(s): Malik Maaza; Claude Sella; Mustapha Kaabouchi; Jean Pierre Ambroise; Bruno Pardo; Francoise Bridou; Monique Miloche; Frantz Wehling; Michel Groos; Gloria Foulet; Hacene Lasri; Ramanthan Krishnan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Diffusion in Ni-Ti multilayers with a period of 120 angstroms is studied in the temperature range of 293 - 743 K by using the grazing angle unpolarized neutron reflectometry. It was shown that Ni diffuses into Ti in this temperature range. The effective diffusion coefficient Deff of Ni into Ti and its corresponding activation energy Qa are determined by measuring the decay of the reflectivity of first Bragg peak arising from the nuclear scattering length density modulation, as a function of annealing temperature at constant time. Two diffusion regimes separated by a pseudo-transition temperature Tc approximately equals 543 K are observed in this Ni-Ti multilayer. The corresponding activation energy values are 0.21 eV and 0.43 eV respectively. The unpolarized neutron reflectivity measurements are completed by crystalline structure, chemical profiling, and magnetic studies.

Paper Details

Date Published: 23 November 1992
PDF: 11 pages
Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130618
Show Author Affiliations
Malik Maaza, CEA-CNRS (France)
Claude Sella, CNRS de Meudon-bellevue (France)
Mustapha Kaabouchi, CNRS de Meudon-bellevue (France)
Jean Pierre Ambroise, CEA-CNRS (France)
Bruno Pardo, Univ. de Paris-Sud (France)
Francoise Bridou, Univ. de Paris-Sud (France)
Monique Miloche, CNRS de Meudon-bellevue (France)
Frantz Wehling, Ecole Centrale de Paris (France)
Michel Groos, Ecole Centrale de Paris (France)
Gloria Foulet, Ecole Centrale de Paris (France)
Hacene Lasri, CNRS de Meudon-bellevue (France)
Ramanthan Krishnan, CNRS de Meudon-bellevue (France)


Published in SPIE Proceedings Vol. 1738:
Neutron Optical Devices and Applications
Charles F. Majkrzak; James L. Wood, Editor(s)

© SPIE. Terms of Use
Back to Top