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Proceedings Paper

Calorimetric measurements of the total hemispherical emittance of selective surfaces at high temperatures
Author(s): A. Brunotte; Michel P. Lazarov; R. Sizmann
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Paper Abstract

An apparatus is presented for measuring the hemispherical emittance (epsilon) in a temperature range of 100 - 400 degree(s)C. It is designed especially for samples with low values of (epsilon) between 0.015 and 0.15. The error margin lies around 6% of the measured value. A polished stainless steel sample (PTB, Braunschweig, Germany) serves as reference reproducing the PTB-results within 2%. Measurements of solar selective absorbers, a TiNxOy-Cu tandem absorber, a multilayer cermet absorber, and an Al2O3-Ni-Al absorber have been carried out. The values of (epsilon) range between 0.02 and 0.15 for 100 degree(s)C and between 0.035 and 0.3 for 400 degree(s)C. TiNxOy-Cu achieves the lowest values in both cases. The effects of temperature on the optical constants in the near IR of TiNxOy-Cu tandem layers are discussed. The results of measurements indicate a shift from dielectric to metallic behavior with rising temperature.

Paper Details

Date Published: 25 November 1992
PDF: 12 pages
Proc. SPIE 1727, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XI: Selective Materials, Concentrators and Reflectors, Transparent Insulation and Superwindows, (25 November 1992); doi: 10.1117/12.130497
Show Author Affiliations
A. Brunotte, Ludwig-Maximilians-Univ. Muenchen (Germany)
Michel P. Lazarov, Ludwig-Maximilians-Univ. Muenchen (Germany)
R. Sizmann, Ludwig-Maximilians-Univ. Muenchen (Germany)


Published in SPIE Proceedings Vol. 1727:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XI: Selective Materials, Concentrators and Reflectors, Transparent Insulation and Superwindows

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