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Proceedings Paper

Advanced Via Inspection Tool
Author(s): Douglas Y. Kim; Kurt Muller; Lawrence D. Thorp; Kenneth A. Bird
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Paper Details

Date Published: 1 August 1992
PDF: 15 pages
Proc. SPIE 1661, Machine Vision Applications in Character Recognition and Industrial Inspection, (1 August 1992); doi: 10.1117/12.130305
Show Author Affiliations
Douglas Y. Kim, IBM/East Fishkill Facility (United States)
Kurt Muller, IBM/East Fishkill Facility (United States)
Lawrence D. Thorp, IBM/East Fishkill Facility (United States)
Kenneth A. Bird, IBM/East Fishkill Facility (United States)


Published in SPIE Proceedings Vol. 1661:
Machine Vision Applications in Character Recognition and Industrial Inspection
Donald P. D'Amato; Wolf-Ekkehard Blanz; Byron E. Dom; Sargur N. Srihari, Editor(s)

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