Share Email Print
cover

Proceedings Paper

Terahertz time-domain spectroscopy of organic semiconductors
Author(s): Daniel M. Hailu; Hany Aziz; Safieddin Safavi-Naeini; Daryoosh Saeedkia
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, we conduct transmission and reflection mode terahertz time-domain spectroscopy (THz-TDS) measurements of organic semiconductors such as ALQ3 and TBADN. THz-TDS is effective for determining the purity of the organic semiconductors based on the refractive index and spectral signatures in THz range. In order to prepare the sample for a custom built sample holder, the powder samples are pressed into pellets of 13 mm diameter and a thickness of 2 mm using a hydraulic press. The organic semiconductor, for example ALQ3 sample, is prepared as a 70% ALQ3 and 30% polyethylene (PE) concentration pellet by mixing ALQ3 and PE. The ALQ3 pellet is measured in a chamber purged with dry nitrogen to avoid the effect of water vapor absorptions in ambient air. The absorption coefficient and index of refraction are measured from the spectra of the reference THz pulse and the THz pulse after transmission through the sample. The THz spectrum is obtained by applying a fast Fourier transform to the THz waveform. Further studies were conducted by reducing the concentration of the organic semiconductor from 70% to 10% ALQ3. We also obtained the spectral signature and absorption coefficient for 50% TBADN 50% PE pellet. The spectral signatures of ALQ3 were found to be at 0.868 THz, 1.271 THz and 1.52 THz, while spectral signature of TBADN was found to be at 1.033 THz.

Paper Details

Date Published: 27 March 2013
PDF: 9 pages
Proc. SPIE 8624, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VI, 86240C (27 March 2013); doi: 10.1117/12.1000097
Show Author Affiliations
Daniel M. Hailu, Univ. of Waterloo (Canada)
Hany Aziz, Univ. of Waterloo (Canada)
Safieddin Safavi-Naeini, Univ. of Waterloo (Canada)
Daryoosh Saeedkia, TeTechS Inc. (Canada)


Published in SPIE Proceedings Vol. 8624:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VI
Laurence P. Sadwick; Créidhe M. O'Sullivan, Editor(s)

© SPIE. Terms of Use
Back to Top