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SPIE Reviews • Open Access

Quantum-limited metrology with nonlinear detection schemes
Author(s): Alfredo Luis

Paper Abstract

Quantum mechanics limit the resolution of detection schemes. Typical arrangements are based on linear processes, so that the corresponding quantum limits are usually understood as unsurpassable and ultimate. Recently it has been shown that nonlinear schemes allow signal detection and measurement with larger resolution than linear processes. In particular, this affects the quantum limits. We review the proposals introduced so far in this novel area of quantum metrology.

Paper Details

Date Published: 1 January 2010
PDF: 21 pages
SR 1(1) 018006 doi: 10.1117/6.0000007
Published in: SPIE Reviews Volume 1, Issue 1
Show Author Affiliations
Alfredo Luis, Univ. Complutense de Madrid (Spain)

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