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Proceedings Paper • Open Access

Opto-Diagnostics for Power Plants
Author(s): Chayan Mitra; Rachit Sharma; Sandip Maity; Sameer Vartak

Paper Abstract

Diode laser sensors and other non-intrusive metrology systems can help predict failures and prevent major accidents and financial losses.

Paper Details

Date Published: 1 July 2011
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6(3) doi: 10.1117/2.4201110.09
Published in: Proceedings Paper Volume 6, Issue 3
Show Author Affiliations
Chayan Mitra, GE India Technology Centre Pvt. Ltd. (India)
Rachit Sharma, GE Global Research (India)
Sandip Maity, GE India Technology Centre Pvt. Ltd. (India)
Sameer Vartak, GE India Technology Centre Pvt. Ltd. (India)


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