Share Email Print

Optical Engineering

Problems of OTF Standardization for Non-Perfect Imaging Devices
Author(s): J. A.J. Van Leunen
Format Member Price Non-Member Price
PDF $20.00 $25.00

Paper Abstract

Three trends are at present apparent in image-evaluation methods. The first trend is to leave the OTF to the theoreticians and replace it by the measurement of imaging characteristics which cover the overall imaging performance of the device under test as completely as possible. In such cases the measuring methods and even the measuring equipment have to be specified.

Paper Details

Date Published: 1 April 1975
PDF: 3 pages
Opt. Eng. 14(2) 142169 doi: 10.1117/12.7978752
Published in: Optical Engineering Volume 14, Issue 2
Show Author Affiliations
J. A.J. Van Leunen, N. V. Philips (Holland)

© SPIE. Terms of Use
Back to Top