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Optical Engineering

Surface And Interior Crack-Tip Field Measurement By An Embedded Random Speckle Method
Author(s): F. P. Chiang; Hua Lu
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Paper Abstract

An embedded random speckle technique is used to measure the displacement in the near-crack-tip fields in four-point-bending beams made of transparent materials. Stress intensity factors or strains in the different planes are generated from the displacement measurements. The results are compared with the existing theoretical and numerical solutions.

Paper Details

Date Published: 1 March 1988
PDF: 4 pages
Opt. Eng. 27(3) 273210 doi: 10.1117/12.7977914
Published in: Optical Engineering Volume 27, Issue 3
Show Author Affiliations
F. P. Chiang, State University of New York at Stony Brook (United States)
Hua Lu, State University of New York at Stony Brook (United States)


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