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Optical Engineering

Surface And Interior Crack-Tip Field Measurement By An Embedded Random Speckle Method
Author(s): F. P. Chiang; Hua Lu
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Paper Details

Date Published: 1 March 1988
PDF: 4 pages
Opt. Eng. 27(3) doi: 10.1117/12.7977914
Published in: Optical Engineering Volume 27, Issue 3
Show Author Affiliations
F. P. Chiang, State University of New York at Stony Brook (United States)
Hua Lu, State University of New York at Stony Brook (United States)


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