Share Email Print

Optical Engineering

Phase Shift Measurements In Electron-Beam-Pumped XeF
Author(s): Richard Scheps
Format Member Price Non-Member Price
PDF $20.00 $25.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Interferometric measurements of the transient refractive index in electron-beam-pumped Ne/Xe/NF3, Ne/Xe, and Ne/NF3 mixtures are reported. The measured fringe shift in the Ne/Xe/NF3 laser mixture at 351 nm is + 5 rad over a 2 m path at an energy loading of 70 J/f, indicating an increase in the refractive index. Energy flow pathway kinetics used in conjunction with fringe shift measurements suggest that the observed shift is due to XeF(B2I1,2). The implications of these measurements for obtaining near- diffraction-limited beam quality in an electron-beam-pumped XeF laser are discussed.

Paper Details

Date Published: 1 September 1989
PDF: 6 pages
Opt. Eng. 28(9) 289969 doi: 10.1117/12.7977071
Published in: Optical Engineering Volume 28, Issue 9
Show Author Affiliations
Richard Scheps, Naval Ocean Systems Center (United States)

© SPIE. Terms of Use
Back to Top