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Optical Engineering

Contrast-Computing Darkroom Exposure Meter
Author(s): Waldemar H. Lehn; R. H. Cook
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Paper Details

Date Published: 1 May 1989
PDF: 3 pages
Opt. Eng. 28(5) doi: 10.1117/12.7976995
Published in: Optical Engineering Volume 28, Issue 5
Show Author Affiliations
Waldemar H. Lehn, University of Manitoba (Canada)
R. H. Cook, University of Manitoba (Canada)

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