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Optical Engineering

Optical Reflection Measurement System Using A Swept Modulation Frequency Technique
Author(s): David M. Braun; Kent W. Leyde
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Paper Abstract

A measurement system has been developed capable of mea-suring reflected optical power as low as 0.0025% with a spot size diam-eter of 24 Am. One application for this system is the characterization of small-area photodetectors. The operation of the measurement system is simple, allowing the operator to quickly make multiple reflection measurements, and it does not require a darkroom. The measurement system merges a microscope, for visual alignment and focusing of the laser beam, with a lightwave component analyzer using modulation vec-tor error correction. A measurement comparison between the analyzer-based system and a power-meter-based system showed that each sys-tem can measure reflections as low as 0.0025%. However, the analyzer-based system offers the advantage of identifying the location and magnitude of system reflections. The system operates at a wavelength of 1310 nm.

Paper Details

Date Published: 1 March 1989
PDF: -285 pages
Opt. Eng. 28(3) 283286 doi: 10.1117/12.7976947
Published in: Optical Engineering Volume 28, Issue 3
Show Author Affiliations
David M. Braun, Hewlett-Packard Company (United States)
Kent W. Leyde, Hewlett-Packard Company (United States)

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