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Optical Engineering

Interferometry On Wolter X-Ray Optics: A Possible Approach
Author(s): Josenh M. Geary
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Paper Abstract

A novel interferometric approach for obtaining surface interferograms on Wolter-type optics is presented. A subaperture simulation experiment shows the data analysis steps required. A second, independent test basically confirms the simulation results. Splicing of the subaperture interferograms around the circumference is discussed.

Paper Details

Date Published: 1 March 1989
PDF: 5 pages
Opt. Eng. 28(3) 283217 doi: 10.1117/12.7976937
Published in: Optical Engineering Volume 28, Issue 3
Show Author Affiliations
Josenh M. Geary, United Technologies Optical Systems (United States)

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