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Optical Engineering

Infrared Spectropolarimetry
Author(s): Dennis H. Goldstein; Russell A. Chipman; David B. Chenault
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Paper Abstract

This paper treats the fundamentals of infrared spectropolarimetry as a step in understanding electro-optical materials and designing better spatial light modulators. It describes the issues in converting a Fourier transform spectrometer to perform spectropolarimetric measurements and includes mathematics to interpret the resulting spectropolarimetric data. Two distinct differences exist between this proposed instrumentation and previous infrared crystal optics studies: (1) this instrument acquires data simultaneously at all wavelengths within its spectral range and (2) it measures Mueller polarization matrices. Conventional measure-ments with laser polarimeters take birefringence data with applied fields at a few laser wavelengths. With the spectropolarimeter, data are obtained over the entire spectrum, including on and near absorption bands where the most interesting phenomena occur. Measuring Mueller matrices as a function of wavelength provides data on polarization and scattering, effects that will ultimately limit the performance of a modulating crystal. Thus, more data are available with which to compare materials and optimize modulator designs. Better modulators must result from such investigations.

Paper Details

Date Published: 1 February 1989
PDF: 6 pages
Opt. Eng. 28(2) 282120 doi: 10.1117/12.7976918
Published in: Optical Engineering Volume 28, Issue 2
Show Author Affiliations
Dennis H. Goldstein, Air Force Armament Laboratory (United States)
Russell A. Chipman, University of Alahama (United States)
David B. Chenault, University of Alahama (United States)

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