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Optical Engineering

Active Layer Thickness Measurement System For Double Heterostructure Laser Wafers
Author(s): Yoshinori Nakano; Nobuyori Tsuzuki
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Paper Details

Date Published: 1 January 1989
PDF: 4 pages
Opt. Eng. 28(1) doi: 10.1117/12.7976899
Published in: Optical Engineering Volume 28, Issue 1
Show Author Affiliations
Yoshinori Nakano, Nippon Telegraph and Telephone Corporation (Japan)
Nobuyori Tsuzuki, Nippon Telegraph and Telephone Corporation (Japan)


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