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Optical Engineering

Curvature And Strain Variations By Rasterography
Author(s): Jacob Politch; S. Gryc; U. Etrog
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Paper Abstract

Rasterography was developed for measurements of three-dimensional surface height distribution. It is extended here to the measurement of strains due to changes in curvature under an object's deformation. The method is demonstrated for a cylindrical shell segment under static loading. However, the method is general in that it can be applied for any curved surface loaded statically.

Paper Details

Date Published: 1 November 1988
PDF: 4 pages
Opt. Eng. 27(11) doi: 10.1117/12.7976801
Published in: Optical Engineering Volume 27, Issue 11
Show Author Affiliations
Jacob Politch, Technion-Israel Institute of Technology (Israel)
S. Gryc, Technion-Israel Institute of Technology (Israel)
U. Etrog, Technion-Israel Institute of Technology (Israel)


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