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Optical Engineering

Flatness Analysis Of Hard Disks
Author(s): Oded Kafri; Kathi Kreske
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Paper Abstract

The special flatness requirements of hard disks are discussed. Color schlieren and grazing incidence interferometry, the two methods currently dominating the market, are compared with the more recently developed moire deflectometry method. We show that since the color schlieren does not detect vital disk flatness information and since interferometry is too vibration sensitive and relatively expensive, moire deflectometry is a superior method for flatness analysis of hard disks.

Paper Details

Date Published: 1 October 1988
PDF: 5 pages
Opt. Eng. 27(10) 271078 doi: 10.1117/12.7976779
Published in: Optical Engineering Volume 27, Issue 10
Show Author Affiliations
Oded Kafri, Rotlex Optics Ltd. (Israel)
Kathi Kreske, Rotlex Optics Ltd. (Israel)

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